By D. Shindo, T. Oikawa, Daisuke Shindo, Tetsuo Oikawa
Analytical electron microscopy is without doubt one of the strongest instruments this day for characterization of the complex fabrics that help the nanotechnology of the twenty-first century. during this booklet the authors sincerely clarify either the elemental rules and the most recent advancements within the box. as well as a primary description of the inelastic scattering procedure, an evidence of the constituent is equipped. normal quantitative analytical concepts making use of electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy also are defined, besides elemental mapping suggestions. integrated are sections on convergent beam electron diffraction and electron holography using the sphere emission gun. With beneficiant use of illustrations and experimental information, this ebook is a necessary source for a person fascinated by fabrics characterization, electron microscopy, fabrics technology, crystallography, and instrumentation.
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Additional info for Analytical Electron Microscopy for Materials Science
3. Set a stopper on the heating knob at the final position after determining the condition. Alignment af an Electran Gun. Make a focused beam in the image mode without a specimen. Next, create an unsaturated condition of the filament by slightly lowering the heating temperature. A detail of a filament pattern can now be observed on the screen. The pattern should be adjusted so it is symmetrical (fourfold symmetry for an LaB 6 filament) by adjusting the tilt knobs (X and Y) of the gun alignmcnt.
The parallel detection system consists of a scintil- 46 3. Electron Energy-Loss Spectroscopy Transmission eleclron microscope V Filament I Illuminating ~ lens system ~ I Sca~ coil Fig. 4. Serial detection system installed on a transmission electron microscope. EELS, electron energyloss spectroscopy 181 Specimen Objective le+ ~ Objective aperture c::::::::>'" I Selected area aperture I [:8:J Magnilying lens system ~ / L,-- Camera chamber - - Entrance aperture ':::::-:5S-=="" Entrance lens 181 _____- .
31. l • Not corrected o Gain corrected 0 103 0 • 0 • • ·0 10 • 0• 0 10-1 100 10 ' 10 2 103 Number 01 incident electrons (e/pixel) 104 Fig. 32. 0 0 10 ' 0 102 •• • 103 '!.!.. 104 Number 01 incident electrons (e/pixel) Fig. 33. 2. Comparison of performances of imaging plates and slow-sean CCD eameras. Pixel size Imaging plates 25 x 2S,um (50 x SO,um) Slow-sean CCD 24 x 24,um Number of pixels Dynamic range Advantage Notes 3000 x 3760 (2048 x 1536) 4-5 figures Possible for various kinds of clectron microscope Fading characteristics 1024 x 1024 (2048 x 2048) 4 figures Digitized image can be seen in a few seeonds Artifaets with too strong electron intensity Pixel sizes and pixel numbers in the typical systems are presented.